K. Classens, W.P.M.H. Heemels, and T. Oomen,

Proceedings of the IEEE International Conference on Mechatronics, Kashiwa, Japan, 2021.


Fault diagnosis is crucial in high-tech production equipment to minimize operational downtime and to facilitate targeted maintenance. Future high-tech systems have numerous complex closed-loop control systems and require compatible fault diagnosis systems. The aim of this paper is to develop a procedure for decentralized fault detection in the presence of additional feedback interconnections. The influence of the additional feedback interconnections on the fault diagnosis system is investigated by means of an illustrative experimental study that resembles a next generation flexible motion system.

Available online at https://doi.org/10.1109/ICM46511.2021.9385700 [pdf]

Categories: Publications